fix(wafer): derive family sensor counts from YAML layouts, bound frame decode to layout

tests/test_device_controller.py

@@ -85,6 +85,10 @@ def test_clear_activity_log(controller):
     controller.clearActivityLog()
     assert len(controller._activity_log) == 0
 
+def test_append_activity_log_appends_to_activity_log(controller):
+    controller.appendActivityLog("Review trial expired")
+    assert "Review trial expired" in controller.activityLog
+
 def test_clear_session(controller):
     controller._connection_status = "Connected"
     controller._selected_port = "COM1"
@@ -236,12 +240,12 @@ def test_parse_and_save_data_and_get_chart_data(controller):
     assert emitted_result is not None
     assert emitted_result.get("success") is True
     assert controller.dataRowCount == 1
-    assert controller.dataColCount == 244
+    assert controller.dataColCount == 48
 
     chart_res = controller.getChartData()
     assert chart_res.get("success") is True
     assert "Sensor1" in chart_res.get("sensor_names")
-    assert len(chart_res.get("series")) == 244
+    assert len(chart_res.get("series")) == 48
 
 def test_logging_handler(controller):
     logger = logging.getLogger("test_logger")